• DocumentCode
    85116
  • Title

    Monolithically Integrated Temperature Sensor in Silicon Carbide Power MOSFETs

  • Author

    Berthou, Maxime ; Godignon, P. ; Millan, James

  • Author_Institution
    Centro Nacional de Microelectron., Inst. de Microelectron. de Barcelona, Bellaterra, Spain
  • Volume
    29
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    4970
  • Lastpage
    4977
  • Abstract
    This paper presents the first integrated temperature sensor in a SiC power mosfet. An analytical model has been proposed to assess its behavior up to 300°C. We present the tested design and its advantages compared to other solutions. We also propose possible optimizations in order to simplify it and reduce its size. 2.25 mm2 power mosfets have been fabricated with and without temperature sensor. Measurements show that the temperature sensor does not impact the power mosfet characteristics and its integration does not demand supplementary process steps. To demonstrate the functionality of our integrated sensor, we have calibrated the temperature dependence of its resistance to assess the internal temperature of the device at different bias.
  • Keywords
    calibration; monolithic integrated circuits; power MOSFET; silicon compounds; temperature measurement; temperature sensors; wide band gap semiconductors; SiC; calibration; device internal temperature assessment; monolithically integrated temperature sensor; optimization; resistance; silicon carbide power MOSFET; Conductivity; Impurities; MOSFET; Resistance; Silicon carbide; Switches; Temperature sensors; Monolithic integrated sensor; p-type SiC; power mosfet; silicon carbide; temperature sensor;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2013.2289013
  • Filename
    6657730