• DocumentCode
    851252
  • Title

    Characterization and passivation effects of an optical accelerometer based on antiresonant waveguides

  • Author

    Llobera, A. ; Plaza, J.A. ; Salinas, I. ; Berganzo, J. ; García, J. ; Esteve, J. ; Dominguez, C.

  • Author_Institution
    Dept. de Microsistemes i Tecnologia de Silici, Inst. de Microelectron. de Barcelona, Spain
  • Volume
    16
  • Issue
    1
  • fYear
    2004
  • Firstpage
    233
  • Lastpage
    235
  • Abstract
    An optical accelerometer based on antiresonant reflecting optical waveguides is presented. The design consists on a quad beam structure where two waveguides are placed on the frame of the accelerometer, while a third is placed over the proof mass. When an acceleration is applied, a misalignment between the three waveguides is immediate, causing a reduction in the output power. If the passivation layer is not considered, simulations predict a nearly symmetrical behavior for positive and negative accelerations, with an optical sensitivity of 2.3 dB/g. Experimental and simulation confirm that passivation modes produce a reduction in the optical sensitivity for positive acceleration values, resulting in an asymmetrical response of the accelerometer.
  • Keywords
    acceleration measurement; accelerometers; micro-optics; microsensors; optical fabrication; optical planar waveguides; optical sensors; passivation; silicon-on-insulator; MOEMS; Si; acceleration measurement; antiresonant reflecting optical waveguides; beam propagation method; integrated optics; nonuniform finite difference method; optical accelerometer; optical sensitivity; passivation layer; proof mass; quad beam structure; rib-ARROW waveguides; silicon-on-insulator technology; waveguides misalignment; Accelerometers; Electromagnetic waveguides; Optical fibers; Optical refraction; Optical sensors; Optical variables control; Optical waveguides; Passivation; Refractive index; Silicon;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2003.818919
  • Filename
    1256009