• DocumentCode
    85171
  • Title

    Energy Resolution Contributions in Reach-Through Avalanche Photodiodes

  • Author

    Gouvea, A.L. ; Fernandes, L.M.P.

  • Author_Institution
    Instrum. Center, Univ. of Coimbra, Coimbra, Portugal
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    2667
  • Lastpage
    2671
  • Abstract
    Avalanche photodiodes (APD) are used in the muonic helium Lamb shift experiment for detection of 8 keV X-rays. Reach-through APDs from Hamamatsu Photonics have been investigated for X-ray detection as alternative to conventional APDs. In order to evaluate the different contributions to the energy resolution obtained in a reach-through APD, its response to both 8 keV X-rays and visible light pulses was investigated. The intrinsic resolution was estimated by further measurements of the electronic noise contribution and the gain non-uniformity was assessed. The excess noise factor was determined. Results at different temperatures are presented.
  • Keywords
    avalanche photodiodes; nuclear electronics; semiconductor device noise; Hamamatsu Photonics; X-ray detection; X-rays pulse; electronic noise contribution; energy resolution; energy resolution contributions; excess noise factor; intrinsic resolution; muonic helium Lamb shift experiment; reach-through APDs; reach-through Avalanche photodiodes; visible light pulse; Avalanche photodiodes; Energy resolution; Noise; Silicon; Temperature; X-ray detection; Avalanche photodiodes; X-ray detectors; electronic noise; energy resolution; excess noise factor; gain non-uniformity; intrinsic resolution; light detection; reach-through avalanche photodiodes;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2356854
  • Filename
    6909079