• DocumentCode
    853057
  • Title

    Large-area high-resolution lithography and photoablation systems for microelectronics and optoelectronics fabrication

  • Author

    Jain, Kanti ; Zemel, Marc ; Klosner, Marc

  • Author_Institution
    Anvik Corp., Hawthorne, NY, USA
  • Volume
    90
  • Issue
    10
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1681
  • Lastpage
    1688
  • Abstract
    An important requirement in the production of numerous microelectronic, optoelectronic, and microsystem devices is lithographic patterning on a large area with high image resolution and precise layer-to-layer alignment. Whereas for production of semiconductor devices advances have been steadily made in steppers and other conventional lithography systems, the lithography requirements for the fabrication of large-format products, such as displays, multilayer circuits, and flexible electronics, are distinctly different, rendering various conventional lithography tools inadequate. These requirements and distinctions of large-area lithography are discussed. In the last several years, we have developed a new class of projection lithography systems that provide both high-resolution imaging and very large exposure area capability with high-precision alignment. The systems, using excimer laser sources, function as dual-mode, high-throughput production tools, capable of patterning in photoresists as well as photoablation in polymers, making them attractive for production of numerous large-format products, with feature sizes ranging from 15 μm to below 1 μm and substrate sizes ranging from 150 × 150 mm to 610 × 915 mm. We review the new lithography system technology, several completed systems, and demonstrated results.
  • Keywords
    display devices; image resolution; integrated circuit technology; laser ablation; micromechanical devices; optoelectronic devices; ultraviolet lithography; 15 to 1 micron; 150 to 915 mm; displays; dual-mode high-throughput production tools; excimer laser sources; feature size range; flexible electronics; high image resolution; high-precision alignment; large-area high-resolution lithography; layer-to-layer alignment; lithographic patterning; microelectromechanical systems; microelectronics fabrication; microsystem devices; multilayer circuits; optoelectronics fabrication; photoablation systems; photoresist patterning; polymer photoablation; projection lithography systems; seamless scanning; substrate size range; Displays; Flexible electronics; Flexible printed circuits; Image resolution; Lithography; Microelectronics; Nonhomogeneous media; Optical device fabrication; Production systems; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2002.803662
  • Filename
    1043926