DocumentCode :
853096
Title :
Interfacial Reaction Between Molten Sn-Bi Based Solders and Electroless Ni-P Coatings for Liquid Solder Interconnects
Author :
Li, Jianfeng ; Mannan, Samjid H. ; Clode, Mike P. ; Liu, Chongqing ; Chen, Keming ; Whalley, David C. ; Hutt, David A. ; Conway, Paul P.
Author_Institution :
Dept. of Mech. Eng., King´´s Coll. London, London
Volume :
31
Issue :
3
fYear :
2008
Firstpage :
574
Lastpage :
585
Abstract :
This paper reports on the interfacial reactions and lifetime of electroless Ni-P coatings in contact with molten Sn-Bi based solders. A layer of approximately 4 mum thick electroless Ni-P in contact with the molten Sn-58Bi solder began to fail at 48 h at temperatures between 200degC and 240degC . Elemental additions to modify the solder, included 1-2wt.% of Al, Cr, Si, Zn, Ag, Au, Ru, Ti, Pt, Nb, and Cu. Of these, only Cu modified the interfacial intermetallic compound growth from Ni3Sn4 to (Cu,Ni)6Sn5 , resulting in significantly decreased consumption rates of the Ni-P substrate in contact with the molten solder and increasing the lifetime of the Ni-P layer to between 430 and 716 h. Micro cracks were observed in all but the thinnest Ni-P layers, allowing the solder to penetrate.
Keywords :
bismuth alloys; electroless deposited coatings; high-temperature electronics; interconnections; interface phenomena; liquid alloys; microcracks; nickel compounds; solders; tin alloys; SnBi-NiP; electroless coatings; high-temperature electronics; interfacial intermetallic compound growth; interfacial reaction; liquid solder interconnects; microcracks; molten solders; temperature 200 C to 240 C; Coatings; high-temperature electronics; interfaces; liquid solder interconnects; metallization; scanning electron microscopy (SEM);
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2008.2001160
Filename :
4618393
Link To Document :
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