• DocumentCode
    853190
  • Title

    Microwave surface resistance measurements of air-atomised spray deposited Tl-Ba-Ca-Cu-O thick films

  • Author

    Jenkins, A.P. ; Su, L.Y. ; Kale, K.S. ; Goringe, M.J. ; Burgoyne, J.W. ; Dew-Hughes, D. ; Grovenor, C.R.M.

  • Author_Institution
    Dept. of Mater., Oxford Univ., UK
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1095
  • Lastpage
    1098
  • Abstract
    The surface resistance (R/sub s/) of spray pyrolysed Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ thick films on 1 inch diameter finely polished yttria-stabilised zirconia disks has been measured using a TE/sub 011/ mode end-wall-replacement cavity at 20 GHz and 77 K. R/sub s/ values of 5.3 m/spl Omega/ and 1.3 m/spl Omega/ at 20 GHz and 10 GHz (scaled assuming an f/sup 2/ dependence) respectively were obtained. These results are the best recorded R/sub s/ values to date for thick films of any superconductor at the same frequencies and at 77 K. Transport critical current density (J/sub c/) measurements on the films exhibited values of >3/spl times/10/sup 4/ A/cm/sup 2/ at 77 K.<>
  • Keywords
    barium compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; microwave measurement; spray coating techniques; spray coatings; superconducting thin films; surface conductivity; thallium compounds; thick films; 1 in; 1.3 mohm; 10 GHz; 20 GHz; 5.3 mohm; 77 K; TE/sub 011/ mode end-wall-replacement cavity; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O; YZrO/sub 2/; YZrO/sub 2/ substrates; air-atomised spray deposited Tl-Ba-Ca-Cu-O thick films; finely polished yttria-stabilised zirconia disks; high temperature superconductors; microwave surface resistance measurements; spray pyrolysed Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ thick films; transport critical current density measurements; Critical current density; Electrical resistance measurement; Frequency; Spraying; Superconducting films; Superconducting microwave devices; Surface resistance; Tellurium; Thick films; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402742
  • Filename
    402742