• DocumentCode
    853240
  • Title

    The effects of deposition parameters on iron films RF diode sputtered in argon-nitrogen

  • Author

    Jones, R.E., Jr. ; Williams, J. ; Staud, N.

  • Author_Institution
    IBM Corp., San Jose, CA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1456
  • Lastpage
    1458
  • Abstract
    Iron-nitrogen films deposited in an argon-N2 sputtering gas were characterized as a function of RF diode sputtering parameters and the N2 partial pressure. The magnetic properties of the films were generally soft until they contained about 1 at.% nitrogen, which corresponded to an impingement rate ratio of nitrogen to iron of about 400 to 1. At that composition Hc and Hk increased abruptly. Optimum substrate bias was found to depend on the substrate used. Annealed films exhibited significant decreases in Hc and Hk , and the saturation magnetostriction could be adjusted to near zero by adding nitrogen. Corrosion properties were also improved with added nitrogen
  • Keywords
    corrosion; iron compounds; magnetic thin films; magnetostriction; sputter deposition; Fe-N; N2 partial pressure; RF diode sputtering; corrosion; deposition parameters; films; saturation magnetostriction; Annealing; Corrosion; Diodes; Iron; Magnetic films; Magnetic properties; Magnetostriction; Nitrogen; Radio frequency; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104409
  • Filename
    104409