DocumentCode
853240
Title
The effects of deposition parameters on iron films RF diode sputtered in argon-nitrogen
Author
Jones, R.E., Jr. ; Williams, J. ; Staud, N.
Author_Institution
IBM Corp., San Jose, CA, USA
Volume
26
Issue
5
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
1456
Lastpage
1458
Abstract
Iron-nitrogen films deposited in an argon-N2 sputtering gas were characterized as a function of RF diode sputtering parameters and the N2 partial pressure. The magnetic properties of the films were generally soft until they contained about 1 at.% nitrogen, which corresponded to an impingement rate ratio of nitrogen to iron of about 400 to 1. At that composition H c and H k increased abruptly. Optimum substrate bias was found to depend on the substrate used. Annealed films exhibited significant decreases in H c and H k , and the saturation magnetostriction could be adjusted to near zero by adding nitrogen. Corrosion properties were also improved with added nitrogen
Keywords
corrosion; iron compounds; magnetic thin films; magnetostriction; sputter deposition; Fe-N; N2 partial pressure; RF diode sputtering; corrosion; deposition parameters; films; saturation magnetostriction; Annealing; Corrosion; Diodes; Iron; Magnetic films; Magnetic properties; Magnetostriction; Nitrogen; Radio frequency; Sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.104409
Filename
104409
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