DocumentCode

853674

Title

Optical maser detection by microwave absorption in semiconductors

Author

Brand, F.A. ; Jacobs, H. ; Weitz, Stefan

Volume

51

Issue

4

fYear

1963

fDate

4/1/1963 12:00:00 AM

Firstpage

607

Lastpage

609

Keywords

Coatings; Electromagnetic wave absorption; Filters; Frequency; Masers; Measurement standards; NIST; Optical detectors; Rough surfaces; Surface roughness;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.2214

Filename

1444144