DocumentCode :
853674
Title :
Optical maser detection by microwave absorption in semiconductors
Author :
Brand, F.A. ; Jacobs, H. ; Weitz, Stefan
Volume :
51
Issue :
4
fYear :
1963
fDate :
4/1/1963 12:00:00 AM
Firstpage :
607
Lastpage :
609
Keywords :
Coatings; Electromagnetic wave absorption; Filters; Frequency; Masers; Measurement standards; NIST; Optical detectors; Rough surfaces; Surface roughness;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.2214
Filename :
1444144
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=853674
