DocumentCode
853841
Title
Energy Straggling of Helium Ions in Aluminium
Author
Oberlin, J.C. ; Amokrane, A. ; Beaumevieille, H. ; Stoquert, J.P.
Author_Institution
Centre des Sciences et de la Technologie Nucléaires, R.P. 1017, Alger, Algérie
Volume
28
Issue
2
fYear
1981
fDate
4/1/1981 12:00:00 AM
Firstpage
1225
Lastpage
1226
Abstract
Straggling of 3He+ ions in thin films of Al has been measured in the energy range 1.1 - 2.3 MeV. The energy straggling was obtained by taking the backscattering spectra of incident ions first from a clean Ta backing, then from an identical Ta backing onto which a thin Al film has been evaporated. The straggling values were compared with predictions of various theories. The results calculated by Bohr and Lindhard-Scharff theories are respectively 15%, and 30% lower than our experimental measurements, whereas those are in good agreement with the Rethe-Livingston theotv.
Keywords
Aluminum; Backscatter; Copper; Electrons; Energy loss; Energy measurement; Energy resolution; Helium; Ion beams; Light scattering;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4331384
Filename
4331384
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