DocumentCode :
853970
Title :
Effect of composition and oxygen content on the microwave properties of evaporated Y-Ba-Cu-O thin films
Author :
Chew, N.G. ; Edwards, J.A. ; Humphreys, R.G. ; Satchell, J.S. ; Goodyear, S.W. ; Dew, B. ; Exon, N.J. ; Hensen, S. ; Lenkens, M. ; Muller, G. ; Orbach-Werbig, S.
Author_Institution :
DRA, Malvern, UK
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
1167
Lastpage :
1172
Abstract :
Thin films of YBa/sub 2/Cu/sub 3/O/sub 7-x/ have been grown by electron beam evaporation of the metals in the presence of atomic oxygen, with small systematic variations in cation composition. Films grown close to the stoichiometric composition or with excess yttrium are smooth while those with excess barium are substantially rougher. The effect of these differences in cation composition on both microwave and dc properties is dominated by the associated large changes in film morphology. This determines the oxygenation state, and hence the electrical properties, of the superconductor both in the as-grown state and after annealing in a furnace or with atomic oxygen. For all films a strong correlation is found between penetration depth, resistivity and c-lattice parameter which all decrease with increasing oxygen content. In our standard growth regime and at higher oxygen contents the films are overdoped and T/sub c/ falls with increasing oxygen content.<>
Keywords :
annealing; barium compounds; electrical resistivity; electron beam deposition; high-frequency effects; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; superconducting transition temperature; yttrium compounds; O content; YBa/sub 2/Cu/sub 3/O/sub 7/; annealing; c-lattice parameter; cation composition; electron beam evaporation; film morphology; high temperature superconductor; penetration depth; resistivity; thin films; transition temperature; Annealing; Atomic beams; Conductivity; Electron beams; Furnaces; Morphology; Superconducting films; Superconducting microwave devices; Transistors; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.402769
Filename :
402769
Link To Document :
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