Title :
Microstructures and properties of laser-ablated epitaxial Y-Ba-Cu-O thin films for electronic device applications
Author :
Yeadon, M. ; Aindow, M. ; Wellhofer, F. ; Abell, J.S. ; Avenhaus, B. ; Lancaster, M.J. ; Woodall, P.
Author_Institution :
Dept. of Metall. & Mater., Birmingham Univ., UK
fDate :
6/1/1995 12:00:00 AM
Abstract :
A study of the microstructures and properties of a series of laser-ablated films of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// on [001] MgO with thicknesses of between 800 and 1900 nm is presented. Transmission electron microscopy has been used to reveal the orientation and defect microstructures of the films and it is shown that both the orientation and threading dislocation content change with deposit thickness. Measurements of surface resistance show no clear correlation with thickness whereas critical current density appears to decrease with increasing thickness. Possible relationships between the microstructures and properties are discussed.<>
Keywords :
barium compounds; critical current density (superconductivity); crystal microstructure; dislocation structure; high-temperature superconductors; pulsed laser deposition; superconducting epitaxial layers; superconducting microwave devices; surface conductivity; transmission electron microscopy; yttrium compounds; MgO; MgO[001]; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/-MgO; critical current density; defect microstructures; deposit thickness; electronic device applications; high temperature superconductors; laser-ablated epitaxial thin films; orientation; superconducting microwave devices; surface resistance; threading dislocation content; transmission electron microscopy; Critical current density; Current measurement; Density measurement; Electrical resistance measurement; Microstructure; Surface resistance; Thickness measurement; Thin film devices; Transmission electron microscopy; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
