• DocumentCode
    855167
  • Title

    Improved performance by optimised planar doped barrier launcher in GaAs vertical FET with very short channel width

  • Author

    Won, Y.H. ; Yamasaki, K. ; Daniels-Race, T. ; Tasker, P.J. ; Schoff, W.J. ; Eastman, L.F.

  • Author_Institution
    Sch. of Electr. Eng. & Nat. Nanofabrication Facility, Cornell Univ., Ithaca, NY, USA
  • Volume
    25
  • Issue
    21
  • fYear
    1989
  • Firstpage
    1413
  • Lastpage
    1414
  • Abstract
    The current-voltage characteristics of a GaAs vertical field effect transistor (VFET) with an n+ip+in+ planar doped barrier (PDB) launcher has been successfully improved by the optimisation of the launcher structure as well as the reduction of the channel width. Electron-beam direct writing has been used to obtain a small channel width of 0.1 approximately 0.15 mu m, resulting in good pinchoff characteristics. The measured maximum transconductances are 383 and 220 mS/mm at 77 and 300 K, respectively. In spite of a very short channel length (0.1 mu m) and relatively low channel doping density (5*1016 cm-3), a high voltage gain of 15 has been obtained.
  • Keywords
    III-V semiconductors; doping profiles; electron beam lithography; field effect transistors; gallium arsenide; 0.1 micron; 300 K; 77 K; GaAs; channel doping density; channel width; current-voltage characteristics; maximum transconductances; n +ip +in + planar doped barrier; optimised planar doped barrier launcher; pinchoff characteristics; vertical field effect transistor; very short channel width; voltage gain;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890943
  • Filename
    46217