• DocumentCode
    855255
  • Title

    Nonlinearities in thin-film media and their impact on data recovery

  • Author

    Moon, Jaekyun ; Zhu, Jian-Gang

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    29
  • Issue
    1
  • fYear
    1993
  • fDate
    1/1/1993 12:00:00 AM
  • Firstpage
    177
  • Lastpage
    182
  • Abstract
    Nonlinear distortion in thin-film media is studied based on dibit magnetization patterns created from a micromagnetic computer simulation. It is observed that the demagnetization field from previously written transitions causes large nonlinear distortions by inducing position shifts of later transitions. Even after the nonlinearities due to such position shifts are removed, significant residual nonlinearities were observed in all media considered. While total nonlinear distortion is larger with films with sharper transitions, the residual nonlinear distortion after the removal of position shifts is larger in the exchange coupled film than the uncoupled film. An attempt was also made to quantify the nonlinear effects on the performance of two competing modulation codes, namely, the rate 8/9 (0,k) code and the rate 2/3 (1,7) code. The results suggest that, despite the higher rate loss, the (1,7) code remains highly competitive against the more recently introduced (0,k) code, as the increased minimum transition spacing provides considerable immunity against nonlinear distortion
  • Keywords
    codes; demagnetisation; magnetic disc storage; magnetic recording; magnetic thin films; (0,k) code; (1,7) code; data recovery; demagnetization field; dibit magnetization patterns; magnetic recording media; micromagnetic computer simulation; minimum transition spacing; modulation codes; nonlinear distortions; performance; position shifts; residual nonlinearities; thin-film media; Crystallization; Magnetic anisotropy; Magnetic field measurement; Magnetostatics; Micromagnetics; Modulation coding; Nonlinear distortion; Perpendicular magnetic anisotropy; Saturation magnetization; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.195566
  • Filename
    195566