Title :
Compact floating-gate true random number generator
Author :
Xu, P. ; Wong, Y.L. ; Horiuchi, T.K. ; Abshire, P.A.
Author_Institution :
Dept. of Electr., Univ. of Maryland, College Park, MD
Abstract :
A compact true random number generator (RNG) integrated circuit with adjustable probability is presented. Hot-electron injection is used in a floating-gate MOSFET to program the probability. Measurements show no cross-correlation between adjacent RNG circuits, allowing multiple RNGs to be easily integrated
Keywords :
MOS logic circuits; hot carriers; logic gates; probability; random number generation; RNG integrated circuits; compact true random number generator integrated circuit; floating-gate MOSFET; hot-electron injection;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20062472
