Very thin CoCr films on titanium underlayers for high-density perpendicular recording computer discs

Author

Mapps, D.J. ; Akhter, M.A. ; Pan, G.

Author_Institution

Dept. of Electr. & Electron. Eng., Plymouth, UK

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

1614

Lastpage

1616

Abstract

Very thin CoCr films with and without a Ti underlayer were deposited on strengthened glass disk substrates by bias RF-sputtering. Perpendicular M-H loops were successfully measured by a polar Kerr M-O loop plotter. Very pronounced effects of the Ti underlayer and bias on the shearing of the loop and the perpendicular remanence ratio were observed. X-ray diffraction results show excellent (002) orientation of CoCr films with Ti underlayers. Experimental results are discussed in the light of the particulate model and the stripe domain model

Keywords

Kerr magneto-optical effect; X-ray diffraction examination of materials; chromium alloys; cobalt alloys; magnetic disc storage; magnetic hysteresis; magnetic recording; magnetic thin films; sputtered coatings; titanium; (002) orientation; CoCr-Ti; M-H loops; Ti underlayer; X-ray diffraction; bias RF-sputtering; high-density perpendicular recording computer discs; particulate model; perpendicular remanence ratio; polar Kerr M-O loop plotter; strengthened glass disk substrates; stripe domain model; thin CoCr films; Coercive force; Glass; Magnetic films; Optical films; Perpendicular magnetic recording; Reflection; Remanence; Shearing; Skin; Titanium;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104465

Filename

104465