DocumentCode
856023
Title
Microstrip conductor losses calculated by full wave and perturbational approaches
Author
Krowne, C.M.
Author_Institution
Naval Res. Lab., Washington, DC
Volume
24
Issue
9
fYear
1988
fDate
4/28/1988 12:00:00 AM
Firstpage
552
Lastpage
553
Abstract
Losses due to ohmic conductor scattering mechanisms are incorporated into two different approaches, one using a skin effect perturbational method and the other using a full wave dyadic modification technique. Numerical results are compared for 1-20 GHz
Keywords
losses; strip lines; 1 to 20 GHz; dyadic modification technique; full wave; ohmic conductor scattering mechanisms; perturbational approaches; skin effect;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
Filename
19564
Link To Document