DocumentCode

856063

Title

Effects of gamma radiation on reversed-biased silicon junctions

Author

Kerr, D.R.

Volume

51

Issue

8

fYear

1963

Firstpage

1142

Lastpage

1142

Keywords

Degradation; Diodes; Gamma rays; Ionizing radiation; Lead compounds; Leakage current; Passivation; Pollution measurement; Silicon compounds; Testing;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.2453

Filename

1444383