DocumentCode :
856104
Title :
Power-law nature of field-effect transistor experimental characteristics
Author :
Richer, I. ; Middlebrook, R.D.
Volume :
51
Issue :
8
fYear :
1963
Firstpage :
1145
Lastpage :
1146
Keywords :
Current measurement; FETs; Impurities; Laboratories; NASA; P-n junctions; Propulsion; Space technology; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.2457
Filename :
1444387
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=856104
