DocumentCode
856243
Title
Developments in Non-Destructive Beam Diagnostics
Author
Fraser, J.S.
Author_Institution
Atomic Energy of Canada Limited Chalk River Nuclear Laboratories Chalk River, Ontario K0J 1J0
Volume
28
Issue
3
fYear
1981
fDate
6/1/1981 12:00:00 AM
Firstpage
2137
Lastpage
2141
Abstract
With the large average beam currents being achieved in accelerators and storage rings, there is an increasing need for non-destructive beam diagnostic devices. For continuous beams, position monitors of the capacitive pick-up type are replaced by resonant devices that respond to the transverse displacement of the beam centroid. Bunch length monitors of the SLAC type using resonant cavities operating in the TM0l0 mode can be used for continuous beams. The more detailed information derivable from beam profile scanners requires development of improved non-destructive devices. Profile monitors which scan the visible light produced by high current beams may be more reliable than ones using the residual ionization if the light intensity from gas molecules following nonionizing collisions with beam particles gives a measure of the beam current density independent of the local electron density. The intense Balmer series lines from neutral hydrogen beams have been used successfully to measure beam profiles. At CRNL and at LASL, beam light profile monitors are being developed for high average current accelerators. Three or more projections will be recorded to allow tomographic reconstruction of the two-dimensional beam current density. Light detection is either by intensified Reticons or ISIT vidicons. The use of three or more beam light monitors on a beam transport line will also permit estimates of the transverse emittance to be made through the reconstruction technique.
Keywords
Current density; Current measurement; Density measurement; Electron beams; Ionization; Particle beam measurements; Particle beams; Particle measurements; Resonance; Storage rings;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4331615
Filename
4331615
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