AC susceptibility investigation of YBa/sub 2/Cu/sub 3/O/sub 7/ thin films

Author

Xing, W. ; Heinrich, B. ; Hu Zhou ; Fife, A.A. ; Cragg, R.A.

Author_Institution

Simon Fraser Univ., Burnaby, BC, Canada

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

1420

Lastpage

1423

Abstract

Temperature dependence of ac susceptibilities, /spl chi/=/spl chi/\´-i/spl chi/", were studied on YBa/sub 2/Cu/sub 3/O/sub 7/ thin films as a function of ac frequency and driving field. The data were compared with theoretical calculations. Critical current densities were estimated by using the peak positions of /spl chi/". The critical current densities were found in good agreement with those obtained by the screening and the scanning Hall-probe techniques. The thermally activated flux creep model describes well the observed frequency dependent /spl chi/" peak temperature.<>

Keywords

Hall effect; barium compounds; critical current density (superconductivity); flux creep; high-temperature superconductors; magnetic susceptibility; superconducting thin films; yttrium compounds; AC susceptibility; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub 7/ thin films; critical current densities; flux creep model; high temperature superconductor; scanning Hall-probe techniques; temperature dependence; Density measurement; Discrete wavelet transforms; Energy measurement; Frequency measurement; Loss measurement; Position measurement; Temperature; Transistors; Volume measurement; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.402831

Filename

402831