See-Through Si Thin-Film Tandem Solar Cell Module With Hardener

Author

Shoou-Jinn Chang ; Ching-In Wu ; Sheng-Po Chang

Author_Institution

Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

Volume

4

Issue

4

fYear

2014

fDate

Jul-14

Firstpage

1013

Lastpage

1017

Abstract

The authors propose an easy and cost-effective method for improving the reliability of see-through tandem modules. By adding hardener to the conventional see-through tandem modules, it was found that we could enhance the 1000-h-damp-heat-test degradation ratio from 82.64% to 89.6%, a near 7% enhancement. It was also found that the efficiency degraded only by 6.0% for the see-through tandem modules with hardener, after six IEC cycles. The smaller degradation ratio indicates that the see-through tandem modules with hardener were more reliable, as compared with the non-see-through tandem modules.

Keywords

elemental semiconductors; semiconductor device reliability; semiconductor thin films; silicon; solar cells; IEC cycles; Si; damp-heat-test degradation ratio; hardener; see-through Si thin-film tandem solar cell module; see-through tandem module reliability; time 1000 h; Degradation; Educational institutions; IEC; Photovoltaic cells; Reliability; Silicon; Degradation; Si thin-film solar cells; hardener; module; see-through;

fLanguage

English

Journal_Title

Photovoltaics, IEEE Journal of

Publisher

ieee

ISSN

2156-3381

Type

jour

DOI

10.1109/JPHOTOV.2014.2314573

Filename

6802338