CMOS circuit testing via time-resolved luminescence measurements and simulations

Author

Stellari, Franco ; Tosi, Alberto ; Zappa, Franco ; Cova, Sergio

Author_Institution

Dipt. di Elethonica e Informazione, Politecnico di Milano, Italy

Volume

53

Issue

1

fYear

2004

Firstpage

163

Lastpage

169

Abstract

The continuous trend in modern CMOS technology toward smaller devices and faster clock frequency is challenging the picosecond imaging circuit analysis technique. In this paper we discuss the role of the single-photon avalanche diode with very sharp time resolution in testing CMOS circuits. Thanks to the 30 ps-time resolution, innovative measurements regarding delays and jitter are presented, along with a case study. A compact model of the luminescence is also proposed and used to compare on-chip electrical signals with optical waveforms.

Keywords

CMOS integrated circuits; SPICE; VLSI; avalanche photodiodes; circuit simulation; high-speed optical techniques; hot carriers; integrated circuit testing; photoluminescence; photon counting; timing jitter; CMOS circuit testing; MOSFET photoemission; SPICE model; VLSI circuits; bias conditions; compact model; delays; emission intensity; hot-carrier luminescence; jitter; on-chip electrical signals; optical waveforms; picosecond imaging circuit analysis; picosecond time resolution; sharp time resolution; simulations; single-photon avalanche diode; time correlated photon counting; time-resolved luminescence measurement; CMOS technology; Circuit analysis; Circuit simulation; Circuit testing; Clocks; Diodes; Frequency; Luminescence; Optical imaging; Signal resolution;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.822195

Filename

1259540