New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic

Author

Hamad, Ghaith Bany ; Hasan, Syed Rafay ; Mohamed, O. Ait ; Savaria, Yvon

Author_Institution

Groupe de Rech. en Microelectron. et Microsystemes, Polytech. Montreal, Montréal, QC, Canada

Volume

61

Issue

4

fYear

2014

fDate

Aug. 2014

Firstpage

1618

Lastpage

1627

Abstract

An investigation of the Single Event Transient (SET) characteristics (amplitude and width) variation while propagating through static and True Single Phase Clock (TSPC) logic is presented. The dependencies of the SET characteristics on the input patterns, propagation paths, pulse polarity, diverging paths, and re-converging paths are investigated. New insights on the propagation induced pulse broadening (PIPB) phenomenon in different combinations of static and TSPC logic are reported. The worst and the best propagation paths for SET pulse broadening and attenuation are identified. Our results demonstrate that SET pulses propagation can lead to Byzantine faults as they propagate through diverging paths. A new way to abstract all possible interpretations of the SET induced Byzantine fault phenomenon is proposed.

Keywords

CMOS integrated circuits; Byzantine faults; SET characteristics; SET pulse broadening; TSPC logic; True Single Phase Clock; diverging paths; input patterns; propa- gation induced pulse broadening phenomenon; propagation paths; pulse polarity; re-converging paths; single event transient propagation; CMOS integrated circuits; Clocks; Logic gates; Pulse generation; Semiconductor device modeling; Single event transients; Transistors; Broadening; True Single Phase Clocked (TSPC); byzantine faults; diverging paths; input pattern; propagation induced pulse broadening (PIPB); propagation path; re-converging paths; single event transient (SET); soft errors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2014.2305434

Filename

6802346