• DocumentCode
    860150
  • Title

    Signal resolution of RSFQ comparators

  • Author

    Filippov, T.V. ; Polyakov, Y.A. ; Semenov, V.K. ; Likharev, K.K.

  • Author_Institution
    State Univ. of New York, Stony Brook, NY, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    2240
  • Lastpage
    2243
  • Abstract
    We have designed and tested a Rapid Single-Flux-Quantum (RSFQ) circuit for experimental measurement of the fluctuation-induced threshold uncertainty of switching of SFQ comparators, which are essential components of RSFQ logic devices, analog-to-digital converters, and digital SQUIDs. Statistical density of the switching events in comparators using externally-overdamped Nb-trilayer Josephson junctions has been found to be in agreement with the distribution which follows from a simple theory based on a time-dependent harmonic-oscillator model of the device. Width of the distribution (i.e, the single-shot current resolution of the comparator) measured as a function of temperature in the range 1.7-4.2 K corresponds to fundamental (thermal/quantum) fluctuations, with no evidence of excess noise sources.<>
  • Keywords
    Josephson effect; analogue-digital conversion; current comparators; signal resolution; superconducting device noise; superconducting logic circuits; superconducting switches; 1.7 to 4.2 K; Josephson junction switching dynamics; Nb; RSFQ comparators; RSFQ logic devices; analog-to-digital converters; digital SQUIDs; externally-overdamped Nb-trilayer Josephson junctions; fluctuation-induced threshold uncertainty; quantum fluctuations; rapid single-flux-quantum circuit; signal resolution; single-shot current resolution; switching event statistical density; thermal fluctuations; time-dependent harmonic-oscillator model; Analog-digital conversion; Circuit testing; Current measurement; Josephson junctions; Logic devices; Logic testing; Noise measurement; SQUIDs; Signal resolution; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403031
  • Filename
    403031