DocumentCode
86085
Title
Narrow Linewidth 1550 nm Corrugated Ridge Waveguide DFB Lasers
Author
Dridi, K. ; Benhsaien, A. ; Zhang, Juyong ; Hall, Trevor J.
Author_Institution
Photonic Technol. Lab., Univ. of Ottawa, Ottawa, ON, Canada
Volume
26
Issue
12
fYear
2014
fDate
15-Jun-14
Firstpage
1192
Lastpage
1195
Abstract
We report on the design and characterization of InP-based multiple quantum well corrugated ridge waveguide distributed feedback diode lasers operating at 1550 nm. Third-order gratings have been etched along the sidewalls of the ridge waveguide using the standard I-line stepper lithography technique with an inductively coupled reactive ion etching process. An as-cleaved 1500-μm-long laser diode shows stable continuous wave single-mode operation at 1550 nm with high side-mode suppression ratios (>50 dB), a temperature-dependent wavelength shift dλ/dT ~0.095 nm/°C, and output powers ≥7 mW at 25 °C. Linewidth determination has been carried using the delayed self-heterodyne interferometric technique. Narrow linewidths (≤250 kHz) have been observed for a wide range of current injection, with a minimum of 184 kHz at 300 mA.
Keywords
III-V semiconductors; diffraction gratings; distributed feedback lasers; indium compounds; laser modes; laser stability; photolithography; quantum well lasers; ridge waveguides; sputter etching; waveguide lasers; InP; InP-based multiple quantum well corrugated ridge waveguide distributed feedback diode lasers; current 300 mA; current injection; delayed self-heterodyne interferometric technique; inductively coupled reactive ion etching process; narrow linewidth corrugated ridge waveguide DFB lasers; output power; side-mode suppression ratio; size 1500 mum; stable continuous wave single-mode operation; standard I-line stepper lithography; temperature 25 degC; temperature-dependent wavelength shift; third-order gratings; wavelength 1550 nm; Distributed feedback devices; Gratings; Laser feedback; Laser modes; Measurement by laser beam; Semiconductor lasers; Waveguide lasers; Distributed feedback (DFB) lasers; InP/InGaAsP multiple quantum well (MQW); Lorentzian lineshape; Voigt profile; delayed self-heterodyne interferometry; stepper lithography;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2014.2318593
Filename
6802359
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