Magnetic properties of a new grade of thin grain-oriented 3% silicon-iron

Author

Perrier, J.C. ; Lebouc, A. ; Brissonneau, P. ; Waeckerle, Th. ; Verdun, J.

Author_Institution

Lab. d´´Electrotech. de Grenoble, CNRS, St. Martin d´´Heres, France

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2214

Lastpage

2216

Abstract

It is pointed out that thin-gauge electrical sheets (thickness less than 0.20 mm) hold a privileged position when equipment operates at medium frequencies and often in nonsinusoidal induction conditions. The magnetic properties of two samples obtained by two different fabrication processes are compared. The first was prepared by rolling standard-gauge GO (grain-oriented) sheets at the required thickness, and the second was obtained by direct recrystallization at the final thicknesses. The latter sample presents better characteristics than the former in sinusoidal as well as in trapezoidal induction. It is concluded that better control of the secondary recrystallization process for the GOSS texture makes it possible to elaborate thin grain-oriented 3% silicon-iron by direct recrystallization at the final thicknesses

Keywords

iron alloys; magnetic properties of substances; silicon alloys; Fe; GOSS texture; Si; direct recrystallization; fabrication processes; magnetic properties; nonsinusoidal induction conditions; secondary recrystallization; standard-gauge grain-oriented sheets; thin grain-oriented Si-Fe; thin-gauge electrical sheets; trapezoidal induction; Annealing; Coatings; Crystallization; Fabrication; Frequency; Grain size; Laboratories; Magnetic cores; Magnetic materials; Magnetic properties;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104673

Filename

104673