• DocumentCode
    86135
  • Title

    High-Yield Fabrication Process for 3D-Stacked Ultrathin Chip Packages Using Photo-Definable Polyimide and Symmetry in Packages

  • Author

    Priyabadini, Swarnakamal ; Sterken, Tom ; Cauwe, Maarten ; Van Hoorebeke, Luc ; Vanfleteren, Jan

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Ghent Univ., Ghent, Belgium
  • Volume
    4
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    158
  • Lastpage
    167
  • Abstract
    Getting output of multiple chips within the volume of a single chip is the driving force behind development of this novel 3D integration technology, which has a broad range of industrial and medical electronic applications. This goal is achieved in a two-step approach. Initially, thinned dies are embedded in a polyimide interposer with a fine-pitch metal fanout, resulting in ultrathin chip packages (UTCPs). Next these UTCPs are stacked by lamination. Step height at the chip edge of these UTCPs is the major reason of die cracking during the lamination. This paper contains an approach to solve this issue by the introduction of an additional layer of interposer, which makes it flat at the chip edge and thus the whole package is named as flat-UTCP. In addition to that, randomness in nonfunctional package positions per panel reduces the overall yield of the whole process up to a certain extent. A detailed analysis on these two issues to improve the process yield is presented in this paper. 3D-stacked memory module composed of four electrically erasable programmable read-only memory dies was processed and tested to demonstrate this new concept for enhancing the fabrication yield.
  • Keywords
    fine-pitch technology; integrated circuit packaging; integrated circuit yield; polymers; three-dimensional integrated circuits; 3D integration technology; 3D-stacked memory module; 3D-stacked ultrathin chip packages; chip edge; die cracking; fabrication yield; fine-pitch metal fanout; flat-UTCP; high-yield fabrication process; industrial electronic applications; lamination; medical electronic applications; multiple chips; nonfunctional package positions; photo-definable polyimide; polyimide interposer; process yield; read-only memory dies; single chip; step height; thinned dies; Bonding; Glass; Lamination; Polyimides; Stacking; Substrates; Electrically erasable programmable read-only memory (EEPROM) memory dies stacking; flat ultrathin chip package (UTCP); package-on-package (PoP) alignment; rotational symmetry;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2284068
  • Filename
    6657822