Title :
Transparent surface modeling from a pair of polarization images
Author :
Miyazaki, Daisuke ; Kagesawa, Masataka ; Ikeuchi, Katsushi
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
Abstract :
We propose a method for measuring surface shapes of transparent objects by using a polarizing filter. Generally, the light reflected from an object is partially polarized. The degree of polarization depends upon the incident angle, which, in turn, depends upon the surface normal. Therefore, we can obtain surface normals of objects by observing the degree of polarization at each surface point. Unfortunately, the correspondence between the degree of polarization and the surface normal is not one to one. Hence, to obtain the correct surface normal, we have to solve the ambiguity problem. In this paper, we introduce a method to solve the ambiguity by comparing the polarization data in two objects, i.e., normal position and tilted with small angle position. We also discuss the geometrical features of the object surface and propose a method for matching two sets of polarization data at identical points on the object surface.
Keywords :
computer vision; object recognition; polarisation; shape measurement; solid modelling; transparency; computer vision; incident angle; light reflection; object surface normal; partially polarized light; polarization images; polarizing filter; surface shapes measuring method; transparent objects; transparent surface modeling; Application software; Computer vision; Filters; Glass; Optical polarization; Optical reflection; Photometry; Shape measurement; Solid modeling; Virtual reality; Algorithms; Artificial Intelligence; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Microscopy, Polarization; Models, Theoretical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2004.1261080