Title :
GaN HEMT Potential for Low-Noise Highly Linear RF Applications
Author :
Khalil, I. ; Liero, A. ; Rudolph, M. ; Lossy, R. ; Heinrich, W.
Author_Institution :
Ferdinand-Braun-Inst., Berlin
Abstract :
This paper presents a study of the capability of gallium-nitride (GaN) high-electron mobility transistors (HEMTs) to achieve low noise and high linearity performance. A packaged GaN HEMT was measured in a 50 - Omega system at 2 GHz. Noise figures slightly above 1.8 dB were achieved together with a record third-order intercept point of 54 dBm. The same configuration yields a maximum output power of 30 W, with 50% power-added efficiency. This combination of high power and low-noise performance allows the realization of highly linear low-noise amplifiers, which could significantly reduce protection and filter efforts at receiver inputs.
Keywords :
III-V semiconductors; MMIC; gallium compounds; high electron mobility transistors; low noise amplifiers; semiconductor device noise; wide band gap semiconductors; GaN; amplifier distortion; amplifier noise; cross modulation distortion; frequency 2 GHz; gallium-nitride high-electron mobility transistors; intermodulation distortion; linear low-noise amplifiers; microwave power field-effect transistor amplifiers; power 30 W; semiconductor device noise; Gallium nitride; HEMTs; Linearity; Low-noise amplifiers; MODFETs; Noise figure; Packaging; Power amplifiers; Power generation; Radio frequency; Amplifier distortion; amplifier noise; cross modulation distortion; distortion; intermodulation distortion (IMD); microwave power field-effect transistor (FET) amplifiers; semiconductor device noise;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2008.2002458