RSFQ pseudo random generator and its possible applications

Author

Kidiyarova-Shevchenko, A.Yu. ; Zinoviev, D.Yu.

Author_Institution

Inst. of Nucl. Phys., Moscow State Univ., Russia

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

2820

Lastpage

2822

Abstract

We have analyzed theoretically and simulated a set of 4-bit RSFQ-logic-based Pseudo Random Generators (PRG). These circuits have been fabricated using low-T/sub c/ niobium technology. We have also investigated experimentally an XOR cell and a shift register with parallel outputs that have been used as compound parts of the PRGs. Experimentally measured margins for DC power supply voltage for a PRG with a serial output, an XOR cell and shift register were 10%, 15%, and 15% respectively. In this paper we discuss various possible applications of a PRG in testing RSFQ circuits and also as a source of "quasiwhite" digital noise.<>

Keywords

niobium; shift registers; signal generators; superconducting device noise; superconducting logic circuits; type II superconductors; white noise; 4 bit; DC power supply voltage; Nb; RSFQ pseudo random generator; XOR cell; low-T/sub c/ technology; parallel outputs; quasiwhite digital noise; shift register; Circuit noise; Circuit testing; Frequency; High temperature superconductors; Logic devices; Logic testing; Nuclear power generation; Shift registers; Signal generators; Superconducting device noise;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.403178

Filename

403178