Title :
Dependence of timing jitter on bias level for single-mode semiconductor lasers under high speed operations
Author :
Mirasso, Claudio R. ; Colet, Pere ; Miguel, Maxi San
Author_Institution :
Dept. de Fisica, Univ. de les Illes Balears, Palma de Mallorca, Spain
fDate :
1/1/1993 12:00:00 AM
Abstract :
The dependence on the bias level of some quantities characterizing optical pulse statistics, such as the turn-on time, pulsewidth, maximum output photon number, and average output power, of single-mode semiconductor lasers is numerically analyzed at frequencies in the gigahertz range. Periodic modulation and pseudorandom word modulation are considered. In the former regime, timing jitter is shown to be rather independent of the bias current. In the latter regime, timing jitter becomes larger when biasing above threshold than when biasing below threshold. This larger jitter is found to be associated with a bimodal probability distribution of the turn-on time, which yields undesirable pattern effects. A privileged bias, slightly below threshold, suppresses these pattern effects making the laser response almost independent of previous input bits. For such bias value the probability distribution functions of the turn-on time in the case of the periodic and pseudorandom word modulation coincide
Keywords :
laser modes; laser theory; optical modulation; probability; semiconductor lasers; statistical analysis; average output power; bias current; bias level; biasing above threshold; biasing below threshold; bimodal probability distribution; distribution functions; gigahertz range; high speed operations; input bits; laser response; maximum output photon number; optical modulation; optical pulse statistics; periodic modulation; pseudorandom word modulation; pulsewidth; single-mode semiconductor lasers; timing jitter; turn-on time; undesirable pattern effects; Delay; Fluctuations; Laser noise; Optical noise; Optical pulse shaping; Optical pulses; Pulse modulation; Semiconductor device noise; Semiconductor lasers; Timing jitter;
Journal_Title :
Quantum Electronics, IEEE Journal of