DocumentCode

863306

Title

Surface Chemical Treatment Effects in Ultra-High Purity P-Type Si Detectors

Author

Takami, Y. ; Shiraishi, F. ; Hosoe, M.

Author_Institution

Institute for Atomic Energy, Rikkyo University, Nagasaka, Yokosuka, Kanagawa, 240-01, Japan

Volume

30

Issue

1

fYear

1983

Firstpage

376

Lastpage

379

Keywords

Chemicals; Detectors; Electrodes; Face detection; Gold; Hafnium; Leak detection; Leakage current; Surface treatment; Temperature;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1983.4332292

Filename

4332292