• DocumentCode
    863327
  • Title

    Vertical c-axis microbridge junctions in YBa/sub 2/Cu/sub 3/O/sub 7//PrBa/sub 2/Cu/sub 3/O/sub 7/ thin films

  • Author

    Goodyear, S.W. ; Chew, N.G. ; Humphreys, R.G. ; Satchell, J.S. ; Lander, K.

  • Author_Institution
    DRA, Malvern, UK
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    3143
  • Lastpage
    3146
  • Abstract
    The fabrication and measurement of microbridge junctions in the vertical c-axis direction of YBCO/PBCO/YBCO evaporated thin films is described. Single junctions show critical current modulation with applied magnetic field, the period scaling with junction size. The IV characteristics show Shapiro steps to high order when irradiated with microwaves. Initial measurements of linear arrays suggest that with further optimisation of the processing steps a reproducible junction technology could emerge. Very low inductance (L/spl ap/5-15 pH) SQUIDs have been demonstrated with dV/d/spl Phi/>1 mV//spl Phi//sub 0/ at 50 K. The vertical SQUID loop geometry of these SQUIDs has allowed a direct determination of the penetration depth as a function of temperature.<>
  • Keywords
    SQUIDs; barium compounds; critical current density (superconductivity); electron device manufacture; inductance; penetration depth (superconductivity); praseodymium compounds; superconducting device testing; superconducting logic circuits; superconducting microbridges; yttrium compounds; 50 K; IV characteristics; SQUIDs; Shapiro steps; YBa/sub 2/Cu/sub 3/O/sub 7/-PrBa/sub 2/Cu/sub 3/O/sub 7/; critical current modulation; inductance; junction size; linear arrays; loop geometry; microbridge junctions; penetration depth; reproducible junction technology; vertical c-axis direction; Critical current; Fabrication; Geometry; Inductance; Magnetic field measurement; Magnetic modulators; SQUIDs; Temperature; Transistors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403258
  • Filename
    403258