DocumentCode
863419
Title
Active Shape Models with Invariant Optimal Features: Application to Facial Analysis
Author
Sukno, Federico M. ; Ordás, Sebastián ; Butakoff, Constantine ; Cruz, Santiago ; Frangi, Alejandro F.
Author_Institution
Pompeu Fabra Univ., Barcelona
Volume
29
Issue
7
fYear
2007
fDate
7/1/2007 12:00:00 AM
Firstpage
1105
Lastpage
1117
Abstract
This work is framed in the field of statistical face analysis. In particular, the problem of accurate segmentation of prominent features of the face in frontal view images is addressed. We propose a method that generalizes linear active shape models (ASMs)l which have already been used for this task. The technique is built upon the development of a nonlinear intensity model, incorporating a reduced set of differential invariant features as local image descriptors. These features are invariant to rigid transformations, and a subset of them is chosen by sequential feature selection for each landmark and resolution level. The new approach overcomes the unimodality and Gaussianity assumptions of classical ASMs regarding the distribution of the intensity values across the training set. Our methodology has demonstrated a significant improvement in segmentation precision as compared to the linear ASM and optimal features ASM (a nonlinear extension of the pioneer algorithm) in the tests performed on AR, XM2VTS, and EQUINOX databases.
Keywords
Gaussian processes; face recognition; feature extraction; image resolution; image segmentation; statistical analysis; Gaussianity assumptions; active shape models; invariant optimal features; local image descriptors; nonlinear intensity model; prominent features segmentation; resolution level; sequential feature selection; statistical face analysis; Active appearance model; Active shape model; Face detection; Face recognition; Facial features; Gaussian distribution; Image recognition; Image segmentation; Performance evaluation; Testing; Face and gesture recognition; feature evaluation and selection; invariants; shape model; statistical image analysis.; Algorithms; Artificial Intelligence; Biometry; Computer Simulation; Face; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Models, Biological; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2007.1041
Filename
4204156
Link To Document