DocumentCode
863518
Title
Determination of conductivity type from MOS-capacitance measurements
Author
Heiman, F.P. ; Zaininger, K.H. ; Warfield, G.
Volume
52
Issue
7
fYear
1964
fDate
7/1/1964 12:00:00 AM
Firstpage
863
Lastpage
864
Keywords
Capacitance measurement; Conducting materials; Conductivity measurement; Gratings; Optical films; Pollution measurement; Space charge; Surface contamination; Testing; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1964.3154
Filename
1445084
Link To Document