DocumentCode
86471
Title
Orientational Dependence in Device Performances of InAs and Si Nanowire MOSFETs Under Ballistic Transport
Author
Shimoida, K. ; Yamada, Y. ; Tsuchiya, H. ; Ogawa, M.
Author_Institution
Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
Volume
60
Issue
1
fYear
2013
fDate
Jan. 2013
Firstpage
117
Lastpage
122
Abstract
We evaluate drive currents and consumption powers of InAs and Si nanowire metal-oxide-semiconductor field-effect transistors (MOSFETs) with various crystal orientations, by using a ballistic MOSFET model coupled with tight-binding band structure calculation. We demonstrate that performance dependence on the wire orientation is not significant in InAs NWFETs compared to Si NWFETs, due to an isotropic nature of the Γ valley, and furthermore, a lower power switching is expected in InAs NWFETs even if the gate oxide thickness reduces down to a quantum capacitance limit. The present results suggest that InAs NWFETs have the advantage over the Si counterpart in terms of lower power operation and flexibility in layout design of integrated circuits.
Keywords
III-V semiconductors; MOSFET; ballistic transport; crystal orientation; elemental semiconductors; indium compounds; nanowires; silicon; tight-binding calculations; InAs; NWFET; Si; ballistic MOSFET model; ballistic transport; consumption power; crystal orientation; device performance; drive current; gate oxide thickness; integrated circuit; isotropic nature; layout design; nanowire MOSFET; nanowire metal-oxide-semiconductor field-effect transistor; orientational dependence; quantum capacitance limit; tight-binding band structure calculation; wire orientation; Logic gates; MOSFETs; Performance evaluation; Quantum capacitance; Silicon; Switches; Ballistic transport; current drive; high-mobility semiconductors; nanowire (NW) transistors; power delay product (PDP); quantum capacitance (QC); tight-binding (TB) approach;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2228199
Filename
6375803
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