• DocumentCode
    86471
  • Title

    Orientational Dependence in Device Performances of InAs and Si Nanowire MOSFETs Under Ballistic Transport

  • Author

    Shimoida, K. ; Yamada, Y. ; Tsuchiya, H. ; Ogawa, M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    117
  • Lastpage
    122
  • Abstract
    We evaluate drive currents and consumption powers of InAs and Si nanowire metal-oxide-semiconductor field-effect transistors (MOSFETs) with various crystal orientations, by using a ballistic MOSFET model coupled with tight-binding band structure calculation. We demonstrate that performance dependence on the wire orientation is not significant in InAs NWFETs compared to Si NWFETs, due to an isotropic nature of the Γ valley, and furthermore, a lower power switching is expected in InAs NWFETs even if the gate oxide thickness reduces down to a quantum capacitance limit. The present results suggest that InAs NWFETs have the advantage over the Si counterpart in terms of lower power operation and flexibility in layout design of integrated circuits.
  • Keywords
    III-V semiconductors; MOSFET; ballistic transport; crystal orientation; elemental semiconductors; indium compounds; nanowires; silicon; tight-binding calculations; InAs; NWFET; Si; ballistic MOSFET model; ballistic transport; consumption power; crystal orientation; device performance; drive current; gate oxide thickness; integrated circuit; isotropic nature; layout design; nanowire MOSFET; nanowire metal-oxide-semiconductor field-effect transistor; orientational dependence; quantum capacitance limit; tight-binding band structure calculation; wire orientation; Logic gates; MOSFETs; Performance evaluation; Quantum capacitance; Silicon; Switches; Ballistic transport; current drive; high-mobility semiconductors; nanowire (NW) transistors; power delay product (PDP); quantum capacitance (QC); tight-binding (TB) approach;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2228199
  • Filename
    6375803