Title :
Improve the performance of orthogonal ASK/DPSK optical label switching by DC-balanced line encoding
Author :
Chi, Nan ; Xu, Lin ; Zhang, Jianfeng ; Holm-Nielsen, Pablo V. ; Peucheret, Christophe ; Yu, Siyuan ; Jeppesen, Palle
Author_Institution :
Res. Center COM, Tech. Univ. of Denmark, Lyngby
fDate :
3/1/2006 12:00:00 AM
Abstract :
Orthogonal amplitude shift keying/differential phase-shift keying (ASK/DPSK) labeling is a promising approach to ultrahigh packet-rate routing and forwarding in the optical layer. However, the limitation on the payload extinction ratio (ER) is a detrimental effect for network scalability and transparency. This paper presents theoretical and experimental studies of ASK/DPSK labeling. It proposes that dc-balanced 8B10B coding can greatly improve ER tolerance, which in turn leads to better system performance. By using the 8B10B coding method, the paper demonstrates transmission and optical label swapping for a 40 Gb/s ASK payload and a 2.5 Gb/s DPSK label with an overall power penalty of 3.3 dB for the payload and 0.3 dB for the label. The experimental results also show that the ER is allowed to be as high as 12 dB
Keywords :
amplitude shift keying; differential phase shift keying; encoding; optical fibre networks; telecommunication network routing; transparency; 2.5 Gbit/s; 40 Gbit/s; 8B10B coding; ASK labeling; DC-balanced line encoding; DPSK labeling; ER tolerance; amplitude shift keying; differential phase-shift keying; network scalability; network transparency; optical label swapping; optical label switching; optical layer; optical transmission; orthogonal ASK; orthogonal DPSK; payload extinction ratio; ultrahigh packet-rate forwarding; ultrahigh packet-rate routing; Amplitude shift keying; Differential phase shift keying; Differential quadrature phase shift keying; Encoding; Erbium; Extinction ratio; Labeling; Payloads; Routing; Scalability; Amplitude shift keying; differential phase shift keying; optical label switching; orthogonal modulation;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2005.863274