Title :
Recent Work Using the ANL HVEM-Ion Beam Interface
Author :
Taylor, A. ; Ryan, E.A.
Author_Institution :
HVEM-Tandem Facility, Materials Science & Technology Division Bldg. 212, Argonne National Laboratory 9700 S. Cass Avenue, Argonne, Illinois, 60439 USA
fDate :
4/1/1983 12:00:00 AM
Abstract :
The ANL-Materials Science and Technology Division High Voltage Electron Microscope-Tandem Facility is a unique national research facility for in-situ studies of the interaction of energetic particle with solids. The ion-beam interface permits ion beams from either a 300-kV Texas Nuclear or a 2-MV National Electrostatics Tandem accelerator to be transported into the stage of our Kratos EM7 1.2-MV HVEM. The current status of research projects employing the ion-beam interface is reported.
Keywords :
Electron microscopy; Electrostatics; Ion accelerators; Ion beams; Ion implantation; Laboratories; Magnetic analysis; Magnets; Materials science and technology; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332505
