DocumentCode
866036
Title
Efficient and economical test equipment setup using procorrelation
Author
Lin, Bin-Hong ; Luh, Hwei-Tsu Ann ; Wu, Cheng-Wen
Author_Institution
Intellectual Property Libr. Co., Taiwan
Volume
21
Issue
1
fYear
2004
Firstpage
34
Lastpage
43
Abstract
The procorrelation system (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.
Keywords
automatic test software; integrated circuit manufacture; integrated circuit testing; statistical analysis; deep-submicron ICs; full-wafer probing; premanufactured recorded correlation wafer; procorrelation system; statistical analysis; test equipment setup; test software; Cost benefit analysis; Degradation; Mass production; Performance evaluation; Personal communication networks; Probes; Retirement; Semiconductor device manufacture; Test equipment; Testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.1261848
Filename
1261848
Link To Document