DocumentCode
866217
Title
Erasure effect in thin film media
Author
Yamauchi, T. ; Tomita, T.
Author_Institution
Mitsubishi Kasei Corp., Yokohama, Japan
Volume
26
Issue
5
fYear
1990
fDate
9/1/1990 12:00:00 AM
Firstpage
2460
Lastpage
2462
Abstract
Nonlinearity caused by the erasure effect was investigated experimentally for a metal-in-gap head (minicomposite type) having a 3-μm sendust layer at the trailing edge of the gap. Decreasing the peak value of media modulation noise is shown to reduce nonlinearity. The written transition width changes the media modulation noise at each recording frequency, but does not change the peak value of the media noise
Keywords
magnetic heads; magnetic thin film devices; random noise; erasure effect; media modulation noise; metal-in-gap head; nonlinearity; sendust layer; thin film media; written transition width; Function approximation; Linearity; Magnetic field measurement; Magnetic heads; Magnetic noise; Magnetic recording; Noise measurement; Pulse measurements; Time measurement; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.104764
Filename
104764
Link To Document