Title :
Erasure effect in thin film media
Author :
Yamauchi, T. ; Tomita, T.
Author_Institution :
Mitsubishi Kasei Corp., Yokohama, Japan
fDate :
9/1/1990 12:00:00 AM
Abstract :
Nonlinearity caused by the erasure effect was investigated experimentally for a metal-in-gap head (minicomposite type) having a 3-μm sendust layer at the trailing edge of the gap. Decreasing the peak value of media modulation noise is shown to reduce nonlinearity. The written transition width changes the media modulation noise at each recording frequency, but does not change the peak value of the media noise
Keywords :
magnetic heads; magnetic thin film devices; random noise; erasure effect; media modulation noise; metal-in-gap head; nonlinearity; sendust layer; thin film media; written transition width; Function approximation; Linearity; Magnetic field measurement; Magnetic heads; Magnetic noise; Magnetic recording; Noise measurement; Pulse measurements; Time measurement; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
