Wall-Voltage Stability in AC-PDP Dielectric Barrier Discharges

Author

Yuxiang Chen ; Qing Li ; Kai Hu ; Wenjian Kuang ; Tolner, H.

Author_Institution

Display Center, Southeast Univ., Nanjing, China

Volume

41

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

159

Lastpage

164

Abstract

The wall-voltage loss in PDPs with four different types of protective layers, i.e., undoped MgO, Si-doped MgO, Sc-doped MgO, and MgCaO (15%) plasma, are compared. Using a two-electrode opposed-discharge-type PDP, the change in external panel voltage needed to get a new discharge is measured as a function of the waiting time from 5 μs to 50 ms, the number of sustain cycles (1-1024), and the sustain frequency. The results shows that the wall-voltage loss cannot only be caused by amplified exoemission but that dielectric relaxation effects might also play an important role.

Keywords

dielectric relaxation; discharges (electric); elemental semiconductors; magnesium compounds; plasma devices; plasma diagnostics; plasma transport processes; scandium; silicon; AC-PDP dielectric barrier discharges; MgCaO; MgO; MgO:Sc; MgO:Si; Sc-doped MgCaO; Si-doped MgO; dielectric relaxation effects; discharge measurement; external panel voltage; protective layers; time 5 mus to 50 ms; two-electrode opposed-discharge-type PDP; undoped MgO; wall-voltage loss; wall-voltage stability; Dielectrics; Discharges (electric); Electrodes; Loss measurement; Partial discharges; Voltage measurement; Xenon; Dielectric barrier; dielectric relaxation; dielectric-plasma interaction; exoemission; low-temperature plasma; neon xenon; wall voltage;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2012.2227829

Filename

6375847