• DocumentCode
    866781
  • Title

    A CAD framework for simulation and optimization of high-speed VLSI interconnections

  • Author

    Griffith, Richard ; Chiprout, Eli ; Zhang, Qi-Jun ; Nakhla, Michel

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
  • Volume
    39
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    893
  • Lastpage
    906
  • Abstract
    A CAD framework addressing three specific aspects of the high-speed interconnect problem, namely, simulation, sensitivity analysis, and performance optimization, is described. Distributed interconnect models represented by uniform or nonuniform lossy coupled transmission lines are supported. The CAD framework incorporates parallel processing capabilities. It also provides a design environment for integrating accurate simulations or waveform estimation, sensitivity analysis, design specifications, and numerical optimization. Approaches enhancing the accuracy and ensuring the stability of moment-matching techniques used in the asymptotic waveform evaluation (AWE) are introduced. Also described are a parallel implementation of numerical inversion of the Laplace transform (NILT) and parallel interconnect optimization, resulting in substantial CPU speedup over existing NILT simulation and optimization
  • Keywords
    Laplace transforms; VLSI; circuit CAD; circuit analysis computing; digital simulation; distributed parameter networks; optimisation; packaging; parallel processing; sensitivity analysis; transmission line theory; CAD framework; Laplace transform; asymptotic waveform evaluation; computer aided design; design environment; high-speed VLSI interconnections; lossy coupled transmission lines; moment-matching techniques; numerical inversion; parallel processing capabilities; performance optimization; sensitivity analysis; simulation; waveform estimation; Analytical models; Asymptotic stability; Couplings; Design automation; Design optimization; Parallel processing; Propagation losses; Sensitivity analysis; Transmission lines; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.199888
  • Filename
    199888