Transient simulation of arbitrary nonuniform interconnection structures characterized by scattering parameters

A noniterative time-dependent circuit model is presented for transient analysis of general uniform and nonuniform interconnection structures terminated with arbitrary, linear or nonlinear loads. Simulated or measured scattering parameter data are used to characterize the interconnection structures. No approximations or model fitting are required. At each point in time, all coupled ports of the interconnection structure are modeled as extended Thevenin equivalents, which consist of constant resistances and time-dependent voltage sources. This new general circuit representation is compatible with existing simulation programs such as SPICE. Simulations on circuits with linear and nonlinear loads illustrate the approach