• DocumentCode
    868205
  • Title

    Let´s measure volcanic phenomena

  • Author

    Andò, Bruno

  • Volume
    5
  • Issue
    4
  • fYear
    2002
  • fDate
    12/1/2002 12:00:00 AM
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    Monitoring activity in the proximity of an active volcano is a critical task performed daily by experts. Due to the high sensitivity of the instruments and the harsh operating conditions, several influencing parameters affect the measurement process and force the use of either a compensation method or data post-processing. When performing microgravity measurements in volcanic areas, it has been affirmed that temperature and pressure fluctuations seriously affect the output of continuously running spring gravity meters. Complex measurement systems are required to achieve accurate results. Scientists are also interested in measuring geophysical parameters to understand the natural phenomena in both seismic and volcanic areas that cause eruptions and earthquakes. Due to the effect of external factors on the measurements, the acquired data is characterized by significant uncertainties, which must be evaluated to make the investigations coherent. Synergy between geophysical phenomena, measurement methodology, and complex techniques for data processing is required to deal with such complex tasks.
  • Keywords
    geophysical signal processing; geophysical techniques; volcanology; active volcano; compensation method; continuously running spring gravity meters; data post-processing; earthquakes; eruptions; geophysical parameters; harsh operating conditions; measurement process; microgravity measurements; pressure fluctuations; seismic areas; temperature fluctuations; volcanic areas; Area measurement; Fluctuations; Force measurement; Geophysical measurements; Instruments; Performance evaluation; Pressure measurement; Seismic measurements; Temperature sensors; Volcanoes;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2002.1048986
  • Filename
    1048986