Title :
Four-channel parallel 3.125 Gbit/s/ch/s fibre optic receiver/transmitter chip signal detection circuit
Author :
Chang, Jae J. ; Abrams, M. ; Kim, Young ; Bien, E. ; Lee, Myunghee
Author_Institution :
Fiber Opt. Bus. Unit, Agilent Technol., Inc., San Jose, CA, USA
fDate :
11/21/2002 12:00:00 AM
Abstract :
A signal detect/loss of signal (SD/LOS) circuit for a four-channel parallel TX/RX chip was designed and fabricated in a 0.35 μm SiGe HBT process. The measurement was performed in power supply range (3.0-3.6 V) and case temperatures (0-100°C) under the influence of cross-talk from the other RX channels and transmitter channels. The result shows a typical assert level of -20.5 dBm and a de-assert level of -21.5 dBm with a typical hysteresis of 1 dB.
Keywords :
bipolar integrated circuits; mixed analogue-digital integrated circuits; optical crosstalk; optical receivers; optical signal detection; optical transmitters; 0 to 100 degC; 3.0 to 3.6 V; 3.125 Gbit/s; RX channels; SiGe; SiGe HBT process; assert level; cross-talk; de-assert level; fibre optic receiver/transmitter chip signal detection circuit; four-channel parallel TX/RX chip; hysteresis; parallel optical fibre communication receiver systems; signal detect/loss of signal circuit; transmitter channels;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20021083
