• DocumentCode
    868720
  • Title

    Interface Breakdown During High-Power Microwave Transmission

  • Author

    Neuber, A.A. ; Edmiston, G.F. ; Krile, J.T. ; Krompholz, H. ; Dickens, J.C. ; Kristiansen, M.

  • Author_Institution
    Center for Pulsed Power & Power Electron., Texas Tech. Univ., Lubbock, TX
  • Volume
    43
  • Issue
    1
  • fYear
    2007
  • Firstpage
    496
  • Lastpage
    500
  • Abstract
    The major limiting factor in the transmission of narrowband high-power microwaves (HPM) has been the interface between vacuum-vacuum or even more severely between vacuum-air if HPM are to be radiated into the atmosphere. Extensive studies have identified the physical mechanisms associated with vacuum/dielectric flashover, as opposed to the mechanisms associated with dielectric/air flashover, which are not as well known. Due to the high electron collision frequencies (in the terahertz range) with the background gas molecules, established mitigation methods and concepts of vacuum/dielectric flashover will have to be re-evaluated. The primarily limiting factors of HPM transmission through a dielectric/air interface are presented based on recent experiments at 2.85 GHz. The physics of the involved mechanisms and their practical ramifications are discussed. The potential of surface roughness/geometry for flashover mitigation is addressed as well
  • Keywords
    flashover; microwave devices; microwave technology; surface roughness; vacuum breakdown; 2.85 GHz; background gas molecules; dielectric-air flashover; electron collision frequency; high-power microwave transmission; interface breakdown; narrowband high-power microwaves; surface roughness-geometry; vacuum-dielectric flashover; vacuum-vacuum interface; Atmosphere; Collision mitigation; Dielectrics; Electric breakdown; Electrons; Flashover; Frequency; Narrowband; Physics; Rough surfaces; Dielectric breakdown; high-power microwaves (HPM); surface flashover;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.887680
  • Filename
    4033091