Title :
Single Event-Induced Instability in Linear Voltage Regulators
Author :
Adell, P.C. ; Witulski, A.F. ; Schrimpf, R.D. ; Marec, R. ; Pouget, V. ; Calvel, P. ; Bezerra, F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
Abstract :
SET-induced oscillations were measured on a stable linear-regulator that uses the LM124 op-amp in its regulation block. Simulations showed that single events act as stimuli that initiate a large-signal oscillation in the LM124 differential amplifier and compensation capacitor path. Laser testing validated the analysis and confirmed that transistors connected to the compensation capacitor are the most vulnerable
Keywords :
differential amplifiers; operational amplifiers; radiation effects; transistors; voltage regulators; LM124 op-amp; SET-induced oscillations; compensation capacitor path; differential amplifier; laser testing; stable linear-voltage regulator; transistors; Analog integrated circuits; Application specific integrated circuits; Capacitors; Circuit simulation; Circuit testing; Frequency measurement; Laboratories; Operational amplifiers; Regulators; Voltage; Linear voltage regulator; Single Event Oscillation; macro-model;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.886214
