Title :
From FNS to HEIV: a link between two vision parameter estimation methods
Author :
Chojnacki, Wojciech ; Brooks, Michael J. ; Van den Hengel, Anton ; Gawley, Darren
Author_Institution :
Sch. of Comput. Sci., Adelaide Univ., SA, Australia
Abstract :
Problems requiring accurate determination of parameters from image-based quantities arise often in computer vision. Two recent, independently developed frameworks for estimating such parameters are the FNS and HEIV schemes. Here, it is shown that FNS and a core version of HEIV are essentially equivalent, solving a common underlying equation via different means. The analysis is driven by the search for a nondegenerate form of a certain generalized eigenvalue problem and effectively leads to a new derivation of the relevant case of the HEIV algorithm. This work may be seen as an extension of previous efforts to rationalize and interrelate a spectrum of estimators, including the renormalization method of Kanatani and the normalized eight-point method of Hartley.
Keywords :
computer vision; eigenvalues and eigenfunctions; maximum likelihood estimation; parameter estimation; statistical analysis; Hartley normalized eight point method; Kanatani renormalization method; computer vision; fundamental numerical scheme; generalized eigenvalue problem; heteroscedastic errors-in variables scheme; vision parameter estimation; Algorithm design and analysis; Cameras; Computer vision; Cost function; Covariance matrix; Differential equations; Eigenvalues and eigenfunctions; Maximum likelihood estimation; Minimization methods; Parameter estimation; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Models, Statistical; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Photogrammetry; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2004.1262197