Parametric macromodels of digital I/O ports

Author

Stievano, Igor S. ; Maio, Ivan A. ; Canavero, Flavio G.

Author_Institution

Dept. of Electron., Politecnico di Torino, Italy

Volume

25

Issue

2

fYear

2002

fDate

5/1/2002 12:00:00 AM

Firstpage

255

Lastpage

264

Abstract

Addresses the development of macromodels for input and output ports of a digital device. The proposed macromodels consist of parametric representations that can be obtained from port transient waveforms at the device ports via a well established procedure. The models are implementable as SPICE subcircuits and their accuracy and efficiency are verified by applying the approach to the characterization of transistor-level models of commercial devices.

Keywords

SPICE; digital integrated circuits; electromagnetic compatibility; identification; integrated circuit modelling; network parameters; radial basis function networks; waveform analysis; SPICE subcircuits; accuracy; device ports; digital I/O ports; efficiency; macromodels; parametric representations; port transient waveforms; transistor-level models; Circuit simulation; Digital integrated circuits; Electromagnetic compatibility; Electromagnetic modeling; Equivalent circuits; Integrated circuit interconnections; Integrated circuit modeling; LAN interconnection; Parametric statistics; System identification;

fLanguage

English

Journal_Title

Advanced Packaging, IEEE Transactions on

Publisher

ieee

ISSN

1521-3323

Type

jour

DOI

10.1109/TADVP.2002.803260

Filename

1049637