Title :
Secondary emission formulas
Author_Institution :
Litton Electron Devices, San Carlos, CA, USA
fDate :
4/1/1993 12:00:00 AM
Abstract :
A minor revision is made to the author´s `A New Formula for Secondary Emission Yield´ (ibid., vol.36, no.9, p.1963-7, September 1989) based on the work of A. Shih and C. Hor reported elsewhere in this issue (ibid. vol.40, no.4, p.824-9, Apr. 1993)
Keywords :
secondary electron emission; revision; secondary emission formulas; Analytical models; Electron devices; Electron emission; Equations; Integrated circuit modeling; Rough surfaces; Surface cleaning; Surface roughness; Surface texture; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
